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Bit Error Rate Tester Tektronix

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Blocking factors can also be determined by external marker signals. Application Note Dual-Dirac+ Scope Histograms and BERTScan MeasurementsIntroduction to Dual-Dirac. Strip charts also work on live or recorded error data sets. SF Add Symbol Filtering option SW (used with STR) 1 Opt. http://onlinetvsoftware.net/bit-error/bit-error-rate-tester-pdf.php

BERTScope® DPP Series Digital Pre-emphasis and LE Series Linear EqualizerCondition the test pattern signal by adding controllable amounts of pre-emphasis for use with a Bit Error Rate Tester. Clock/data delay Range Greater than 1 bit period in all cases Up to 1.1 GHz 30 ns Above 1.1 GHz 3 ns Resolution 100 fs Self calibration At time of measurement, when temperature or bit rate Supports asynchronous receiver testing for USB 3.1, SATA, and PCI Express User-specified symbols are automatically filtered from the incoming data to maintain synchronization The Error Detector maintains a count of filtered The BERTScope shown with optical units enabled.

Bit Error Rate Tester Agilent

More Product Support Information PRICE STARTING FROM Contact Us Request a Quote BA1500 BA1600 Datasheet Manual Models Features and Benefits Technical DocumentsSelect an option Models Features and Benefits Technical Documents BA1500 Typical data and clock outputs of the BA1600 at 1.5 Gb/s with 2 V p-p amplitude settings. Test patterns can be either the built-in PRBS patterns, or user-defined patterns. The eye diagram (top left) shows a feature in the crossing region that is unexpected and appearing less frequently than the main eye.

Q-factor is to the amplitude domain what jitter is to the time domain. Pattern synchronization The BA1500 and BA1600 support synchronizing to both PRBS and user-defined patterns (up to 8 Mb). Alternatively, the default mode is Continuous, and the eye or mask test increases in depth over time. Bit Error Rate Test Equipment In this example measurements are converted to the optical domain automatically.

The BitAlyzer has user blank inputs to gate where errors are counted and to control external re-synchronization. Rear-panel low-frequency jitter input can be used to impose additional jitter; the sum of external low-frequency jitter, internal low-frequency SJ to 10 MHz, PCIe LFRJ and PCIe LFSJ (with Option PCISTR) is BERTs have counted every bit and so have provided measurements based on vastly deeper data sets, but have lacked the intuitive presentation of information to aid troubleshooting. PRBS-31) Jitter Patented Error Location Analysis™ enables Rapid Understanding of your BER Performance Limitations and Assess Deterministic versus Random Errors, Perform Detailed Pattern-dependent Error Analysis, Perform Error Burst Analysis, or Error-free

Most standards requiring jitter measurement specify the use of clock recovery, and exactly which loop bandwidth must be used. Bit Error Rate Test Set The other is then used to probe the periphery of the eye to judge parametric performance. Block Error analysis is included in the Physical Layer Test Suite option. Specifications subject to change.

Bit Error Rate Tester Software

contact us Contact CALL1-800-833-9200Available 6:00 AM – 4:30 PM Pacific CONTACT USEmail us with comments, questions or feedback. Duration: 1:16 OIF-CEI Active Optical Cable Testing Designing and developing 100G components, modules and systems requires the latest... Bit Error Rate Tester Agilent For USB 3.1 testing, the switch features a pattern generator for generation of Low Frequency Periodic Signaling (LFPS), used to ensure devices achieve loopback. Bert Bit Error Rate Tester External control of pattern generator and error detector BER experiments often require gating error measurement, precise timing of re-synchronizations and bursty packet-like data.

Because this is so fast, it is convenient to allow re-calibration when changes in temperature or frequency occur that might cause delay error. http://onlinetvsoftware.net/bit-error/bit-error-rate-tester-agilent.php For applications requiring circuit board dispersion, the BSA12500ISI differential ISI accessory board can be used. Pre-emphasis is currently used in 10GBASE-KR, PCIe, SAS 12 Gb/s, DisplayPort®, USB 3.1, and other standards. Masks can also be automatically created from the BER Contour analysis, allowing users to create a golden mask at a prescribed BER level. Bit Error Rate Test

Add the Jitter Map option to see even more layers of jitter decomposition on live data. Users also receive the Quick Start user manual with simple step-by-step tutorials that introduce the analyzer and some of the new analysis features. Key performance specifications Up to 1.6 Gb/s Pattern Generator/Error detector for fast, accurate characterization of digital communications signaling systems PRBS or 8 Mb user-defined patterns provide the versatility to debug or verify any click site contact us Contact CALL1-800-833-9200Available 6:00 AM – 4:30 PM Pacific CONTACT USEmail us with comments, questions or feedback.

Repetitive errors that occur at low frequencies can be isolated with this view. Bit Error Rate Tester Price The FIR Filter can be applied to repeating patterns up to 32,768 bits long. RELIABLE SUPPORTTurn to us with confidence, our friendly team is here to help you.

Graphical representation makes jitter analysis more thorough, yet simpler to follow.Optional Digital Pre-emphasis Processor provides user controlled pre-emphasis on pattern generator supplied data.Enables testing with compliant signals for standards like OIF-CEI3.0,

Presence to Support MRO Products and Service Info » International Wireless Communications Expo (IWCE) 2016 Info » TestEquity demonstrates innovative test and measurement solutions at APEX EXPO 2016 Info » TestEquity The deep, BERT-collected measurements use several orders of magnitude less extrapolation, or in some cases no extrapolation, than oscilloscopes use as a basis for the jitter measurements. Testing interface cards Finally a solution to the age-old problem of making physical layer measurements on high-speed line cards, motherboards, and live traffic – the BERTScope Live Data Analysis option. Bsa286cl Factory presets are included for commonly used logic families.

Data clock waveform performance Rise time 25 ps max, 23 ps typical (10-90%), 1 V amplitude, at 8.0 Gb/s Jitter BSA85C ≤12 psp-p TJ (@8.0 Gb/s) typical ≤700 fs RMS Random Jitter (@8.0 Gb/s) typical BSA125C, BSA175C <500 fs RMS The left-hand and right-hand sides of the jitter distribution are measured separately. TEKTRONIX and TEK are registered trademarks of Tektronix, Inc. navigate to this website Users set the BER threshold and define what to log.

The user interface for BER logging is very straightforward. Users can set up error correction strengths, interleave depths, and erasure capabilities to match popular hardware correction architectures. Users can capture data into the pattern editor from the error detector input and create reference patterns. For speed, user-pattern synchronization can be done by learning a repeating pattern from the incoming data.

random BER errors ANSI Jitter Measurements (RJ, DJ, and TJ) Fast, effective method for determining long pattern PRBS31 jitter composition with triangulation. Compliant measurements are available to you by pairing either of these versatile instruments with your existing investments. An additional modulator and source allows users to stress the clock with high-amplitude, low-frequency Sinusoidal Jitter (SJ). Also included are display of the nominal data frequency and easy-to-use vertical and horizontal cursors.

Digital processing errors will often cause a repetitive error length, while interference will often have some variation in error length. CA1 Single Calibration or Functional Verification Opt. Unlike other BER testers, user-defined patterns can be synchronized using two methods - one for speed and one for accuracy. In systems where only a few picoseconds of jitter count, accurate measurement of jitter is essential for managing tight jitter budgets.